- 檢驗單
- test: n. 【動物；動物學】(軟體類的)介殼，甲殼；【植物；植 ...
- sheet: n. 【航?！?1.繚繩；帆腳索。 2.〔pl.〕(船頭 ...
- testing record sheet: 試驗記錄表; 試驗記錄卡
- double loop-sheet testing machine: 雙卷層薄板試驗機
- sheet metal ductility testing instrument: 金屬板延性試驗儀
下載手機詞典可隨時隨地查詞查翻譯
testing sheet中文什么意思
- 檢驗單
下載手機詞典可隨時隨地查詞查翻譯
例句與用法
- To get the test sheets for us
還幫我們偷試卷 - To get the test sheets for us
還幫我們偷試卷 - Accomplishing the development of square four point probe instrument with the function of image manipulation for testing sheet resistance automatically
4完成具有圖像識別功能的全自動四探針微區(qū)電阻率測試儀的研制。 - In this paper , the circuit used for testing sheet resistance is designed using single chip processor . additionally , we have expressed van der pauw function as a polynomial form through local and global reversal development by using the normalized polynomial match , being convenient not only for programming , but also for sheet resistance testing when using van der pauw and rymaszewski methods
本文還利用單片機系統(tǒng)設(shè)計了薄層電阻測試電路，對于程序中用到的范德堡隱函數(shù)，利用非線性反演和規(guī)范化擬合的方法推導出其多項式顯函數(shù)形式。這不僅給對我們編寫程序提供了方便，也為使用范德堡法和rymaszewski法測量薄層電阻提供了便利。 - At present , the problem in testing sheet resistance for micro - areas is that probes must be set up at the suitable locations by handwork . in order to know the wafer ' s impurity distributing , we need test many times , so will waste a lot of time . if the wafer ' s diameter would be 300mm , this problem will be more serious . in this paper , image analysis is introduced , through pre - processing and edge picking - up , the probe tips are recognized . then probe tips will be aligned respectively in two perpendicular directions through driving stepper motors . thus the distribution of sheet resistance for whole wafer is got by automatic testing and it offers information for detecting the impurity distribution and the diffusion uniformity
這樣，完成200mm ( 8時)圓片雜質(zhì)的擴散分布需要對許多圖形進行測試，需要花費很長的時間，當測試300mm硅片時問題就更為突出。本文將圖象與視覺測量系統(tǒng)引入四探針測試系統(tǒng)中，對采集到的原始探針圖像進行預(yù)處理、邊緣提取等操作，以便實現(xiàn)探針針尖的識別，然后由電機控制實現(xiàn)探針的自動定位。這樣測試系統(tǒng)可以自動獲得全片的薄層電阻分布，為超大規(guī)模集成電路檢測雜質(zhì)分布和擴散的均勻性提供信息。